N. Mirchin, B. Apter, I. Lapsker, V. Fogel, U. Gorodetsky, S. A. Popescu, A. Peled, G. Popescu-Pelin, G. Dorcioman, L. Duta, A. Popescu and I. N. Mihailescu, “Measuring Nanolayer Profiles of Various Materials by Evanescent Light Technique,” Journal of Nanoscience and Nantechnology, Vol. 12, No. 3, 2012, pp. 2668-2671. doi10.1166/jnn.2012.5788 - References

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N. Mirchin, B. Apter, I. Lapsker, V. Fogel, U. Gorodetsky, S. A. Popescu, A. Peled, G. Popescu-Pelin, G. Dorcioman, L. Duta, A. Popescu and I. N. Mihailescu, “Measuring Nanolayer Profiles of Various Materials by Evanescent Light Technique,” Journal of Nanoscience and Nantechnology, Vol. 12, No. 3, 2012, pp. 2668-2671. doi:10.1166/jnn.2012.5788

has been cited by the following article:

TITLE: Palladium Ultra Thin Layer Profiles Evaluation by Evanescent Light

AUTHORS: Nina Mirchin, Igor Lapsker, Ewdard Tannous, Aaron Peled

KEYWORDS: Pd Nanometer Layers; Evanescent Field

JOURNAL NAME: Materials Sciences and Applications, Vol.4 No.9, September 12, 2013

ABSTRACT: Nanometric profiles of sputtered ultra-thin Pd layers with thicknesses in the range 1 - 10 nm were investigated by capturing the leaking evanescent light from optical waveguides. The Pd films were deposited by sputtering on glass substratesalso servingas light waveguides. Calibrating the thickness values for the ultra-thin Pd films obtained from the sputtering rate combined with the DELI estimation technique, gave detailed 1Dand 3D morphological nanometric profiles of the deposited layers.