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N. Mirchin, B. Apter, I. Lapsker, V. Fogel, U. Gorodetsky, S. A. Popescu, A. Peled, G. Popescu-Pelin, G. Dorcioman, L. Duta, A. Popescu and I. N. Mihailescu, “Measuring Nanolayer Profiles of Various Materials by Evanescent Light Technique,” Journal of Nanoscience and Nantechnology, Vol. 12, No. 3, 2012, pp. 2668-2671. doi:10.1166/jnn.2012.5788

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