N. Mirchin, M. Gankin, U. Gorodetsky, S.A. Popescu, I. Lapsker, A. Peled, L. Duta, G. Dorcioman, A. Popescu and I. N. Mihailescu, “Estimation of Polyethylene Nanothin Layer Morphology by Differential Evanescent Light Intensity Imaging,” Journal of Nanophotonics, Vol. 4, No. 1, 2010, Article ID 014760. - References

Browse Menu >>

Browse Subjects >>

Computer Science & Communications

Earth & Environmental Sciences

Social Sciences & Humanities

Why Us? >>

- Open Access
- Peer-reviewed
- Rapid publication
- Lifetime hosting
- Free indexing service
- Free promotion service
- More citations
- Search engine friendly

Free SCIRP Newsletters>>

Add your e-mail address to receive free newsletters from SCIRP.

Contact Us >>

customer@scirp.org

+86 18163351462(WhatsApp)

1655362766

Paper Publishing WeChat

Book Publishing WeChat

(or Email:book@scirp.org)

Article citations
More>>

N. Mirchin, M. Gankin, U. Gorodetsky, S.A. Popescu, I. Lapsker, A. Peled, L. Duta, G. Dorcioman, A. Popescu and I. N. Mihailescu, “Estimation of Polyethylene Nanothin Layer Morphology by Differential Evanescent Light Intensity Imaging,” Journal of Nanophotonics, Vol. 4, No. 1, 2010, Article ID: 014760.

has been cited by the following article:

TITLE: Palladium Ultra Thin Layer Profiles Evaluation by Evanescent Light

AUTHORS: Nina Mirchin, Igor Lapsker, Ewdard Tannous, Aaron Peled

KEYWORDS: Pd Nanometer Layers; Evanescent Field

JOURNAL NAME: Materials Sciences and Applications, Vol.4 No.9, September 12, 2013

ABSTRACT: Nanometric profiles of sputtered ultra-thin Pd layers with thicknesses in the range 1 - 10 nm were investigated by capturing the leaking evanescent light from optical waveguides. The Pd films were deposited by sputtering on glass substratesalso servingas light waveguides. Calibrating the thickness values for the ultra-thin Pd films obtained from the sputtering rate combined with the DELI estimation technique, gave detailed 1Dand 3D morphological nanometric profiles of the deposited layers.