Article citationsMore>>

A. L. Salas-Villasenor, I. Mejia, J. Hovarth, H. N. Alshareef, D. K. Cha, R. Ramirez-Bon, B. E. Gnade and M. A. Quevedo-Lopez, “Impact of Gate Dielectric in Carrier Mobility in Low Temperature Chalcogenide Thin Film Transistors for Flexible Electronics,” Electrochemical and Solid-State Letters, Vol. 13, No. 9, 2010, pp. H313-H316. doi:10.1149/1.3456551

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top