TITLE:
Design a Collector with More Reliability against Defects during Manufacturing in Nanometer Technology, QCA
AUTHORS:
Milad Sang Sefidi, Dariush Abedi, Mehdi Moradian
KEYWORDS:
Collector; Quantum Dot Cells; Fault Tolerance; Quantum Cellular Automata; Nano-Scale Technologies
JOURNAL NAME:
Journal of Software Engineering and Applications,
Vol.6 No.6,
June
18,
2013
ABSTRACT:
Nowadays Quantum Cellular Automata (QCA)
as the leading technology in design of microelectronic systems has been raised.
With respect to high velocity and density in low power and also simple concepts,
this technology is a viable alternative to CMOS technology. In collector design, the primary component of
each processor is very important. Due to the small elements in this technology,
failure rate in manufacturing process technology is very high. In the other hand,
the simulation shows that the intersection point of two wires is one of the critical
points in QCA circuits. This means that defects in the manufacturing process around these
points can cause malfunction in the circuit performance. In this paper, a collector in cross sections of wire in
his new method used higher reliability against defects during manufacturing has been developed. QCA Designer software
is used to simulate the case study system.