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R. S. Ren, M. N. Wang, X. M. Chen and Z. J. Zhang, “Characterization and Molecular Mapping of Yr52 for High-Temperature Adult-Plant Resistance to Stripe Rust in Spring Wheat Germplasm PI 183527,” Theoretical and Applied Genetics, Vol. 125, No. 5, 2012, pp. 847-857.
doi:10.1007/s00122-012-1877-8
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