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C. Y. Chang, S. C. Li, P. C. Chung and J. Y. Kuo, “Automatic Facial Skin Defect Detection System,” Proceeding of 2010 International Conference on Broadband, Wireless Computing, Communication and Applications, 4-6 November 2010, pp. 527-532. doi:10.1109/BWCCA.2010.126

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