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Y. Kobayashi, T. Kaneko, M. Kamogawa, K. Asai, K. Akiyama and H. Funakubo, “Structural Characterization by Electronic Transport Properties on Fe3Si Films,” Journal of Physics D: Applied Physics, Vol. 40, No. 22, 2007, pp. 6873-6878. doi:10.1088/0022-3727/40/22/003

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