Article citationsMore>>

X. Cai and H. Bangert, “Hardness Measurements of Thin Films-Determining the Critical Ratio of Deph to Thickness Using FEM,” Thin Solid Films, Vol. 264, No. 1, 1995, pp. 59-71. doi:10.1016/0040-6090(95)06569-5

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top