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Article citations


Jayavel, P., Amano, T., Choi, D., Furukawa, H., Hiro-Oka, H., Asaka, K. and Ohbayashi, K. (2006) Improved sensitivity of optical frequency domain reflectometry-optical coherence tomography using a semiconductor optical amplifier. Japanese Journal of Applied Physics, 45, L1317- L1319. doi:10.1143/JJAP.45.L1317

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