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Syriopoulos, K., Velders, X.L., Sanderink, G.C., van Ginkel, F.C. and van der Stelt, P.F. (1999) Effects of developer exhaustion on the sensitometric properties of four dental films. Dentomaxillofacial Radiology, 28, 80- 88. doi:10.1038/sj.dmfr.4600416

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