Article citationsMore>>

Karunagaran, B., Kumar, R.T., Kumar, V.S., Mangalaraj, D., Narayandass, S.K. and Rao, G.M. (2003) Structural Characterization of DC Magnetron-Sputtered TiO2 Thin Films Using XRD and Raman Scattering Studies. Materials Science in Semiconductor Processing, 6, 547-550.
https://doi.org/10.1016/j.mssp.2003.05.012

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top