Park, B., Kim, Y.J., Graham, S. and Reichmanis, E. (2011) Change in Electronic States in the Accumulation Layer at Interfaces in a Poly(3-Hexylthiophene) Field-Effect Transistor and the Impact of Encapsulation. ACS Applied Materials Interfaces, 3, 3545-3551.
https://doi.org/10.1021/am200760m

has been cited by the following article:

• TITLE: Effects of Residual Oxygen in the Degradation of the Performance of Organic Bulk Heterojunction Solar Cells: Stability, Role of the Encapsulation

  AUTHORS: Vianou Irénée Madogni, Macaire Agbomahéna, Basile Bruno Kounouhéwa, Olivier Douhéret, Roberto Lazzaroni

  KEYWORDS: Encapsulation, Alteration, Oxidation, Residual Oxygen, Moisture, Impurities

  JOURNAL NAME: Advances in Materials Physics and Chemistry, Vol.8 No.9, September 11, 2018

  ABSTRACT: We have shown in our first articles [1] [2] that even after encapsulation, the first rapid phase of degradation mechanism observed has been attributed to oxidation of interfaces and an alteration of the charges collection process. A second phase slower is induced by the oxidation of the active film, namely a decrease in the absorption and a degradation of the charge transport process. We revealed that another decrease in power conversion efficiency which has been induced by a possible interfacial passivation occurred at the organic/cathode interface, owing to the presence of residual oxygen, moisture and other impurities. This is in reality the real cause of the first rapid phase of degradation mechanism observed.