Article citationsMore>>

Z. Liu, Y. Zhang, S. W. Kok, B. P. Ng and Y. C. Soh, “Near-Field Ellipsometry for Thin Film Characterization,” Optics Express, Vol. 18, No. 4, 2010, pp. 3298-3310. doi:10.1364/OE.18.003298

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top