S. Winkler, “Quality metric design A closer look,” Proceedings of SPIE Human Vision and Electronic Imaging, Vol. 3959, pp. 37–44, San Jose, CA, 2000. - References

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S. Winkler, “Quality metric design: A closer look,” Proceedings of SPIE Human Vision and Electronic Imaging, Vol. 3959, pp. 37–44, San Jose, CA, 2000.

has been cited by the following article:

TITLE: Study on Threshold Patterns with Varying Illumination Using 1.3m Imaging System

AUTHORS: Vinesh SUKUMAR, Herbert L. HESS, Ken V. NOREN, Greg DONOHOE, Suat AY

KEYWORDS: perception threshold, contrast sensitivity

JOURNAL NAME: Intelligent Information Management, Vol.2 No.1, January 27, 2010

ABSTRACT: Human eye can generally distinguish objects from each other or from their background, if the difference in luminance or color is large. This paper concentrates on the luminance portion and makes an attempt to characterize perception detection to varying contrast which is explained in contrast sensitivity terms. This is accomplished using sinusoidal test patterns. Influence of illumination on perception threshold is also shown in this paper. Practical measurements are done using a calibrated monitor with image capture accomplished with a 1/4 1.3M camera module system.