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Schmid, T., Charbiwala, Z., Friedman, J., Cho, Y.H. and Srivastava, M.B. (2008) Exploiting Manufacturing Variations for Compensating Environment Induced Clock Drift in Time Synchronization. ACM SIGMETRICS Performance Evaluation Review—SIGMETRICS’08, 36, 97-108.
https://doi.org/10.1145/1384529.1375469

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