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Vos, R., Lux, M., Xu, K., Fyen, W., Kenens, C., Conard, T., Mertens, P., Heyns, M., Hatcher, Z. and Hoffman, M. (2001) Removal of Submicrometer Particles from Silicon Wafer Surfaces Using HF-Based Cleaning Mixtures. Journal of the Electrochemical Society, 148, G683-G691.
http://dx.doi.org/10.1149/1.1413483

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