Why Us? >>

  • - Open Access
  • - Peer-reviewed
  • - Rapid publication
  • - Lifetime hosting
  • - Free indexing service
  • - Free promotion service
  • - More citations
  • - Search engine friendly

Free SCIRP Newsletters>>

Add your e-mail address to receive free newsletters from SCIRP.

 

Contact Us >>

WhatsApp  +86 18163351462(WhatsApp)
   
Paper Publishing WeChat
Book Publishing WeChat
(or Email:book@scirp.org)

Article citations

More>>

Legutko, S., Kluk, P. and Stoic, A. (2011) Research of the Surface Roughness Created during Pull Broaching Process. METABK, 50, 245-248.

has been cited by the following article:

  • TITLE: Studying the Preheating Effect on Certain Mechanical Properties of the Coating Layer by Vacuum Ion Plasma Coating

    AUTHORS: Abdul Jaleel Hamad Majeed

    KEYWORDS: Fractal Dimension, Roughness, Preheating, Ion-Plasma, Surface Homogeneity

    JOURNAL NAME: Modern Mechanical Engineering, Vol.5 No.4, November 11, 2015

    ABSTRACT: The present paper is concerned with the study of two main points: clarifying the effect of preheating on the surface microscopic shape of coating layer by vacuum ion plasma coating technology and on the amount of micro-hardness besides studying the properties of the surfaces that concern the parts of the mechanical system because of their direct and active effect on the machine efficient performance and machine life in general and their important effect on the product efficiency. As known, the instruments that measure the traditional roughness give us numbers and charts that, to a certain extent, describe the actual state of the surface shape within limited range of accuracy, but it has become necessary to find more accurate methods that suit the development obtained in industry, namely, the important applications like aircraft missiles and others. One of the suggested solutions for this is to get benefit of average fractal dimension for the surface by the help of the new technologies which, in return, help in the possibility to determine the surface state with high accuracy that matches the importance of application.