Colakoglu, T. and Parlak, M. (2008) Structural Characterization of Polycrystalline Ag-In-Se Thin Films Deposited by E-Beam Technique. Applied Surface Science, 254, 1569-1577.
http://dx.doi.org/10.1016/j.apsusc.2007.07.092

has been cited by the following article:

• TITLE: Transport Properties of AgInSe2 Crystals

  AUTHORS: Hamdy T. Shaban, Melaad K. Gergs

  KEYWORDS: Semiconductors, Crystal Growth, X-Ray Diffraction, Transport Properties

  JOURNAL NAME: Materials Sciences and Applications, Vol.5 No.5, April 15, 2014

  ABSTRACT: AgInSe2 crystals were grown by Bridgman technique. The crystals were identified structurally by X-ray diffraction technique. Measurements of electrical conductivity and Hall effect were performed in the temperature range (138 K - 434 K) and (220 K - 488 K) for thermoelectric power measurements. From these measurements, many physical parameters were determined. The energy gap was calculated to be 1.24 eV. The conductivity type was found to be n-type. Crystallite size (D) of the obtained AgInSe2 crystals was calculated to be 70 nm. The lattice parameters for the prepared crystals were a = 6.0938 ? and c = 11.7775 ?.