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N. T. Bagraev, N. G. Galkin, W. Gehlhoff, L. E. Klyachkin and A. M. Malyarenko, “Phase and Amplitude Response of the ‘0.7 Feature’ Caused by Holes in Silicon One-Dimensional Wires and Rings,” J. Phys.:Condens. Matter, Vol. 20, 2008, pp. 164202-1-12. doi:10.1088/0953-8984/20/16/164202

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