TITLE:
The Study of Relaxation Time in Test of 940 nm Semiconductor Laser
AUTHORS:
Jiachun Li, Jianjun Li, Tao Liu, Bifeng Cui, Jun Deng, Jun Han, Linjie He, Shengjie Lin
KEYWORDS:
Semiconductor Laser; Test; Temperature Characteristics; Relaxation Time
JOURNAL NAME:
Journal of Computer and Communications,
Vol.1 No.7,
November
29,
2013
ABSTRACT:
Conventional test of the peak wavelength of a laser used to be applied immediately after a device is injected current.
However, the results can not be considered as an accurate description to
temperature characteristic. This passage puts forward a concept of relaxation time in wavelength texts, mainly based on the experiment of 940 nm strain
quantum well laser, confirming that under constant current, wavelength will get
through a process of rising, and then, reach the limit. This process brings the effect on spectral
characteristics of a device which cannot be ignored and the accumulated heat in relaxation
time will gradually impact the emission wavelength of the laser, even crest
split to form bimodal phenomenon.