Article citationsMore>>

Michalas, L., Lucibello, A., Badino, G., Joseph, C., Brinciotti, E., Kienberger, F., Proietti, E. und Marcelli, R. (2015) Scanning Microwave Microscopy for Nanoscale Characterization of Semiconductors: De-embedding reflection contact mode measurements. Proceedings of the 45th European Microwave Conference, 159-162.

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.