Zhang, J., Liu, C., Cheng, G., Chen, X., Wu, J., Zhu, Q. and Zhang, L. (2014) Constant-Stress Accelerated Life Test of White Organic Light-Emitting Diode Based on Least Square Method Under Weibull Distribution. Journal of Information Display, 15, 71-75.
http://dx.doi.org/10.1080/15980316.2014.889613

has been cited by the following article:

• TITLE: Constant-Stress Accelerated Degradation Life Test of an Organic Light-Emitting Diode Display under Violet Light

  AUTHORS: François-Xavier Fortier, Sylvain G. Cloutier

  KEYWORDS: PMOLED, Displays, Tests and Measurements, Lifetime, Light-Induced Aging, Accelerated Degradation Testing

  JOURNAL NAME: Engineering, Vol.8 No.2, February 6, 2016

  ABSTRACT: The lifetime of commercial OLED display devices increases, so does the need for an accelerated lifetime testing method. The present work proposes a simple and accurate blackbox testing approach for commercial PMOLED display lifetime assessment using violet light-induced accelerated aging. Maximum likelihood estimations using lognormal distributions are performed based on datasets acquired from samples exposed to six different degrees of violet irradiance and accelerated life model is shown to accurately fit experimental data using an inverse power law. Based on these results, weighted average of the logarithmic standard deviation, the average life and median life can then be obtained for specific conditions of operation of the devices. As this method relies exclusively on violet light-induced degradation at room-temperature, this minimally-invasive testing procedure requires no significant modification to the display hardware architecture.