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I. Lowe, L. Jankuloski, S. M. Chao, X. M. Chen, D. See and J. Dubcovsky, “Mapping and Validation of QTL Which Confer Partial Resistance to Broadly Virulent Post-2000 North American Races of Stripe Rust in Hexaploid Wheat,” Theoretical and Applied Genetics, Vol. 123, No 1, 2011, pp. 143-157. doi:10.1007/s00122-011-1573-0

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