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K. R. DeHaan, G. T Vessey, D. A Holmstrom, J. A Mac-Leod, J. B Sanderson and M. R Carter, “Relating Potato Yield to the Level of Soil Degradation Using a Bulk Yield Monitor and Differential Global Positioning Systems,” Computers and Electronics in Agriculture, Vol. 23, No. 2, 1999, pp.133-143. doi:10.1016/S0168-1699(99)00027-7

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