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U. Feldman, J. F. Seely and A. K. Bhatia, “Density sENSITIVE X-Ray Line Ratios in the Bei, Bi, and Nei Isoelectronic Sequences,” Journal of Applied Physics, Vol. 58, No. 11, 1984, pp. 3954-3958. doi:10.1063/1.335569

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