Article citationsMore>>

D. Vincent, H. Rene, M. Sabsabi and L. St-Onge, “An Evaluation of a Commercial Echelle Spectrometer with Intensified Charge-Coupled Device Detector for Materials Analysis by Laser-Induced Plasma Spectroscopy,” Spectrochimica Acta Part B, Vol. 56, No. 6, 2001, pp. 1011-1025. doi:10.1016/S0584-8547(01)00174-4

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top