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M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan and E. W. Van Stryland, “Sensi-tive Measurement of Optical Nonlinearities Using a Single Beam,” IEEE Journal of Quantum Electronics, Vol. 26, No. 4, 1990, pp. 760-769. doi:10.1109/3.53394

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