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D. E. Sayers, E. A. Stern and F. W. Lytle, “New Technique for Investigating Noncrystalline Structures: Fourier Analysis of the Extended X-Ray—Absorption Fine Structure,” Physical Review Letters, Vol. 27, No. 18, 1971, pp. 1204 -1207. doi:10.1103/PhysRevLett.27.1204

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