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Zhao, Y.-P., Wang, G.-C., Lu, T.-M., Palasantzas, G. and De Hosson, J.Th.M. (1999) Surface-Roughness Effect on Capacitance and Leakage Current of an Insulating Film. Physical Review B, 60, 9157.
https://doi.org/10.1103/PhysRevB.60.9157

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