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M. S. Tsai and T. Y. Tseng, “Effect of bottom Electrodes on Dielectric Relaxation and Defect Analysis of (Ba0.47 Sr0.53) TiO3 Thin Film Capacitors,” Materials Chemistry and Physics, Vol. 57, No. 1, 1998, pp. 47-56. doi:10.1016/S0254-0584(98)00199-0

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