Article citationsMore>>

Velterop, L., Delhez, R., de Keijser, Th.H., Mittemeijer, E.J. and Reefman, D. (2000) X-Ray Diffraction Analysis of Stacking and Twin Faults in f.c.c. Metals: A Revision and Allowance for Texture and Non-Uniform Fault Probabilities. Journal of Applied Crystallography, 33, 296.
https://doi.org/10.1107/S0021889800000133

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top