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J. Friis, B. Jiang, John C. H. Spence and R. Holmestad, “Quantitative Convergent Beam Electron Diffraction Measurements of Low-Order Struc-ture Factors in Copper,” Microscopy and Microanalysis, Vol. 9, No. 5, 2003, pp. 379-389. doi:10.1017/S1431927603030319

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