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Joshi, Y., Azar, K., Blackburn, D., Lasance, C.J.M., Mahajan, R. and Rantala, J. (2003) How Well Can We Asses Thermally Driven Reliability Issues in Electronic Systems Today? Sum-mary of Panel Held at the Therminic 2002. Microelectronics Journal, 34, 1195-1201.
http://dx.doi.org/10.1016/S0026-2692(03)00200-3

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