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J. I. Izpura, “1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance,” IEEE Transactions on Instrumentation and Measurement, Vol. 57, No. 3, 2008, pp. 509-517. doi:10.1109/TIM.2007.911642

has been cited by the following article:

  • TITLE: A Fluctuation-Dissipation Model for Electrical Noise

    AUTHORS: Jose-Ignacio Izpura, Javier Malo

    KEYWORDS: Admittance-Based, Noise Model, Fluctuation, Susceptance, Dissipation, Resistance

    JOURNAL NAME: Circuits and Systems, Vol.2 No.3, July 5, 2011

    ABSTRACT: This paper shows that today’s modelling of electrical noise as coming from noisy resistances is a non sense one contradicting their nature as systems bearing an electrical noise. We present a new model for electrical noise that including Johnson and Nyquist work also agrees with the Quantum Mechanical description of noisy systems done by Callen and Welton, where electrical energy fluctuates and is dissipated with time. By the two currents the Admittance function links in frequency domain with their common voltage, this new model shows the connection Cause-Effect that exists between Fluctuation and Dissipation of energy in time domain. In spite of its radical departure from today’s belief on electrical noise in resistors, this Complex model for electrical noise is obtained from Nyquist result by basic concepts of Circuit Theory and Thermo-dynamics that also apply to capacitors and inductors.