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Zhang, K.F., Tang, H.J., Wu, X.L., Li, Y.F., Li, T., Li, X. and Gong, H.M. (2009) Effects of an Anodic Oxide Passivation Layer on Mesa-Type InGaAs (PIN) Photodetectors. Semicond. Sci. Technol., 24, 015008. http://dx.doi.org/10.1088/0268-1242/24/1/015008

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