Article citationsMore>>

W. Gehlhoff, K. Irmscher, N.T. Bagraev, L.E. Klyachkin, A.M. Malyarenko, “Shallow Centers in Heavily Doped Silicon Quantum Wells”, In: C.A.J. Ammerlaan, B. Pajot, Ed., Shallow Level Centres in Semiconductors, World Scientific, Singapore, 1997, pp. 227-232.

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top