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Y. F. Hao, Y. Y. Wang, L. Wang, Z. H. Ni, Z. Q. Wang, R. Wang, C. K. Koo, Z. X. Shen and J. T. L. Thong, “Probing Layer Number and Stacking Order of Few-Layer Graphene by Raman Spectroscopy,” Small, Vol. 6, No. 2, 2010, pp. 195-200. http://dx.doi.org/10.1002/smll.200901173

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