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C. O. Ladd, R. L. Huot, K. V. Thrivikraman, C. B. Nemeroff, M. J. Meaney and P. M. Plotsky, “Long-Term Behavioral and Neuroendocrine Adaptations to Adverse Early Experience,” Progress in Brain Research, Vol. 122, 2000, pp. 81-103.
http://dx.doi.org/10.1016/S0079-6123(08)62132-9

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