Optical Properties of Polycrystalline Zinc Selenide Thin Films
Umesh Khairnar, Sulakshana Behere, Panjabrao Pawar
DOI: 10.4236/msa.2012.31006   PDF    HTML     6,881 Downloads   12,974 Views   Citations


Thin films of ZnSe have been deposited onto glass substrates at 373 K by thermal evaporation technique. The X-ray diffractogram confirmed that ZnSe has cubic type crystal structure. The lattice parameters of thin films are almost matching with the JCPDS 5 - 552 data for Zinc Selenide. The transmittance and reflectance have been measured at normal and near normal incidence, respectively, in the spectral range 200 - 2500 nm. The dependence of absorption coefficient, α in the photon energy have been determined. Analysis of the result showed that films of different thicknesses, direct transition occurs with band gap energies ranges from 2.2 to 2.6 eV. Refractive indices and extinction coefficients have been evaluated in the above spectral range.

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U. Khairnar, S. Behere and P. Pawar, "Optical Properties of Polycrystalline Zinc Selenide Thin Films," Materials Sciences and Applications, Vol. 3 No. 1, 2012, pp. 36-40. doi: 10.4236/msa.2012.31006.

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The authors declare no conflicts of interest.


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