The Optical Parameters of ZnxCd(1-x)Te Chalcogenide Thin Films

DOI: 10.4236/jsemat.2011.12008   PDF   HTML     3,521 Downloads   7,429 Views   Citations


A procedure to make optical quality thin films of ZnxCd(1-x) Te by use of thermal evaporation of the ternary compound has been investigated. Structural and optical properties of ZnxCd(1-x)Te solid solution with x = 0.1 to 0.5 were synthesized, from the resulting ZnTe and CdTe composition used in preparation of thin films. Structural investigation indicates they have polycrystalline structure. Composition was confirmed from EDAX while SEM picture shows homogeneity in films. Plots of (αhν)2 versus (hν) yield straight line indicating direct transition occurs with optical band gap energies in the range 1.7 - 2.3 eV. It is also found with increase Zn content the band gap of the films increases. Refractive indices and extinction coefficients have been evaluated in the spectral range (200 - 2500 nm).

Share and Cite:

U. Khairnar, S. Behere and P. Pawar, "The Optical Parameters of ZnxCd(1-x)Te Chalcogenide Thin Films," Journal of Surface Engineered Materials and Advanced Technology, Vol. 1 No. 2, 2011, pp. 51-55. doi: 10.4236/jsemat.2011.12008.

Conflicts of Interest

The authors declare no conflicts of interest.


[1] T. H. Weng “Flash Evaporated Films of Indium-Doped CdS and CdSxSe1–x,” Journal of Electrochemical Society, Vol. 117, No. 5, 1970, pp. 725-726. doi:10.1149/1.2407616
[2] A. Rohatgi, S. A. Ringel, “Growth and Process Optimization of CdTe and CdZnTe Polycrystalline Films for High Efficiency Solar Cells,” Solar Cells, Vol. 30, No. 1-4, 1991, pp. 109-122. doi:10.1016/0379-6787(91)90043-O
[3] S. I. Radautsan, O. V. Kulikova and O. G. Maksimova, “InSb-ZnxCd(1-x)Te Photosensitive Thin Film MIS – Structures,” Solar Energy Materials, Vol. 20, No. 1-2, 1990, pp. 37-41. doi:10.1016/0165-1633(90)90015-S
[4] N. G. Patel, “Some Observations on the Switching and Memory Phenomenon in ZnTe-Si,” Journal of Materials Science, Vol. 21, No. 6, 1986, pp. 2097. doi:10.1007/BF00547952
[5] J. J. Kennedy, P. M. Amirtharaj and P. R. Boyd, “Growth and Characterization of Cd1?xZnxTe and Hg1?yZnyTe,” Journal of Crystal Growth, Vol. 86, No. 1-4, 1990, pp. 93-99. doi:10.1016/0022-0248(90)90704-O
[6] R. Weil, M. Joucla, J. L. Loison, M. Mazilu, D. Ohlmann, M. Robino and G. Schwalbach, “Preparation of Optical Quality ZnCdTe Thin Films by Vacuum Evaporation,” Applied Optics, Vol. 37, No. 13, 1998, pp. 2681-2686. doi:10.1364/AO.37.002681
[7] S. Mac kowski, G. Karczewski, F. Kyrychenko, T. Wojtowicz and J. Kossut, “Influence of MBE Growth Conditions on Optical Properties of CdTe/ZnTe Quantum Structures,” Thin Solid Films, Vol. 367, No. 1-2, 2000, pp. 210-215. doi:10.1016/S0040-6090(00)00675-1
[8] S. A. Ringel, R. Sudharsanan, A. Rohatgi, M. S. Owens and H. P. Gillis, “Influence of Thermal Annealing on the Structural and Optical Properties of Polycrystalline Cd0.96Zn0.04Te Thin Films,” Journal of Optoelectronics and Advanced Materials, Vol. 7, No. 3, 2005, pp. 1483-1491.
[9] A. Bansal and P. Rajaram, “Electrochemical Growth of CdZnTe Thin Films,” Materials Letters, Vol. 59, No. 28, 2005, pp. 3666-3671. doi:10.1016/j.matlet.2005.06.040
[10] A. Mycielski, A. Szadkowski, E. usakowska, L. Kowalczyk, J. Domagaa, J. Bk-Misiuk and Z. Wilamowski, “Parameters of Substrates–Single Crystals of ZnTe and Cd1?xZnxTe (x < 0.25), Obtained by Physical Vapor Transport Technique (PVT),” Journal of Crystal Growth, Vol. 197, No. 5, 1999, pp. 423-426. doi:10.1016/S0022-0248(98)00740-4
[11] V. M. Lakeenkov, V. B. Utimtsev, N. I. Shmatov and Y. F. Schelkin, “Numeric Simulation of Vertical Bridgman Growth of Cd1?xZnxTe melts,” Journal of Crystal Growth, Vol. 197, No. 3, 1999, pp. 443-448. doi:10.1016/S0022-0248(98)00811-2
[12] J. J. Pankove, “Optical Processes in Semiconductors,” Prentice Hall, Englewood Cliffs, 1971.
[13] Goswami, “Thin Film Fundamentals,” New Age International Publisher, New Delhi, 1996, pp. 442.
[14] M. Sridharan, S. K. Narayandass, D. Mangalaraj and H. C. Lee, “Optical and Opto-Electronic Properties of Polycrystalline Cd0.96Zn0.04Te Thin Films,” Crystal Research Technology, Vol. 38, No. 6, 2003, pp. 479-487. doi:10.1002/crat.200310060
[15] M. S. Joshi and A. S. Vagh, “Role of Spirals in the Growth of Prism Faces of Cultured Quartz,” Journal of Applied Physics, Vol. 37, No. 1, 1966, pp.315-318. doi:10.1063/1.1707833
[16] U. P. Khairnar, D. S. Bhavsar, R. U. Vaidya and G. P. Bhavsar, “Optical Properties of Thermally Evaporated Cadmium Telluride Thin Films,” Materials Chemistry and Physics, Vol. 80, No. 2, 2003, pp. 421-427. doi:10.1016/S0254-0584(02)00336-X
[17] G. G. Rusu, M. Rusu and M. Girtan, “Optical Characterization of Vacuum Evaporated CdZnTe Thin Films Deposited by a Multilayer Method,” Vacuum, Vol. 81, No. 11-12, 2007, pp. 1476-1479. doi:10.1016/j.vacuum.2007.04.003
[18] K. Prabakar, S. Venkatachalam, Y. L. Jeyachandran, S. K. Narayandass and D. Mangalaraj, “Optical Constants of Vacuum Evaporated Cd0.2Zn0.8Te Thin Films,” Solar Energy Materials and Solar Cells, Vol. 81, No. 1, 2004, pp. 1-12. doi:10.1016/j.solmat.2003.08.008
[19] A. Rohatgi, S. A. Ringel, R. Sudharsanan, P. V. Meyears, C. H. Liu and V. Ramanathan, “Investigation of Polycrystalline CdZnTe, CdMnTe, and CdTe Films for Photovoltaic Applications,” Solar Cells, Vol. 27, No. 1-4, 1989, pp. 219-230. doi:10.1016/0379-6787(89)90030-6
[20] M. Sridharan, S. K. Narayandass, D. Mangalaraj, H. C. Lee, “Optical and Opto-Electronic Properties of Polycrystalline Cd0.96Zn0.04Te Thin Films,” Crystal Research Technology, Vol. 38, No. 6, 2003, pp. 479-487. doi:10.1002/crat.200310060
[21] P. Gupta, B. Maiti, A. B. Maity, S. Chaudhari, A. K. Pal, “Optical Properties of ZnxCd1?xSe Films,” Thin Solid Films, Vol. 260, No. 1, 1995, pp. 75-85. doi:10.1016/0040-6090(94)06461-X

comments powered by Disqus

Copyright © 2020 by authors and Scientific Research Publishing Inc.

Creative Commons License

This work and the related PDF file are licensed under a Creative Commons Attribution 4.0 International License.