Analysis of Mobile Phone Reliability Based on Active Disassembly Using Smart Materials
Zhifeng Liu, Liuxian Zhao, Jun Zhong, Xinyu Li, Huanbo Cheng
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DOI: 10.4236/jsemat.2011.12012   PDF    HTML     5,383 Downloads   10,965 Views  

Abstract

When using shape memory materials into active disassembly of actual electronic products, because the elastic modulus of shape memory materials is affected by the temperature is relatively large, therefore, the main difference of environmental reliability between active disassembly products and common products is the impact of collision and vibration under different temperature. Establishing three-dimensional analysis model, comparing the impact of collision and vibration of mobile phone shells which are made up of PVC materials after casting & radiation and PC/ABS materials under different temperature. Analyzing the reliability of mobile phone under different temperature and optimizing its structure according to data of testing.

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Z. Liu, L. Zhao, J. Zhong, X. Li and H. Cheng, "Analysis of Mobile Phone Reliability Based on Active Disassembly Using Smart Materials," Journal of Surface Engineered Materials and Advanced Technology, Vol. 1 No. 2, 2011, pp. 80-87. doi: 10.4236/jsemat.2011.12012.

Conflicts of Interest

The authors declare no conflicts of interest.

References

[1] W. Xu and J. H. Tao, “Research of Recycling Oriented Disassembly Technology,” Machine Tool & Hydraulics, Vol. 37, No. 2, 2009, pp. 24-28.
[2] K. Lee and R Gadh, “Computer Aided Design for Disassembly: A Destructive Approach,” Proceedings of the 1996 IEEE International Symposium on Electronics & the Environment, New Jersey, 1999, pp. 173-178.
[3] R. C. Li, J. J. Tang, X. Hong and K. G. Wu, “Harmful Influence to Environment and Recycling of Discarded Household Appliance,” Environmental Pollution and Control, Vol. 25, No. 4, 2003, pp. 109-110.
[4] F. H. Lian, Q. P. Su, M. H. Wang, Y. Zhang and G. H. Tang, “Recycling and Disposal of the Old and Waste Household Appliances,” Environmental Pollution and Control, Vol. 26, No. 1, 2004, pp. 67-69.
[5] J. Z. Li, P. Shrivastava and Z. Gao, “Printed Circuit Board Recycling: A State-of-the-Art Survey,” Proceeding of the 2002 IEEE International Symposium on Electronics and the Environment, Vol. 27, 2004, pp. 234-241.
[6] K. Lee and R. Gadh, “Computer Aided Design for Disassembly: A Destructive Approach” Proceedings of the 1996 IEEE International Symposium on Electronics & the Environment, New Jersey, 1999, pp. 173-178.
[7] J. D. Chiodo, E. H. Billett and D. J. Harrison, “Preliminary Investigations of Active Disassembly Using Shape Memory Polymers,” Proceedings First International Symposium on Environmentally Conscious Design and Inverse Manufacturing, Tokyo, 1999, pp. 590-595.
[8] S. Seelecke, “Shape Memory Alloy Actuators in Smart Structures: Modeling and simulation,” American Society of Mechanical Engineers, Vol. 57, No. 1, 2004, pp. 23-46.
[9] Z. F. Liu, X. Y. Li and H. C. Zhang, “Research on Design Methods of Products Based on ADSM,” Chinese Journal of Mechanical Engineering, 2009, Vol. 45, No. 10, pp. 192-197. doi:10.3901/JME.2009.10.192
[10] Z. F. Liu, L. X. Zhao, X. Y. Li, H. C. Zhang and H. B. Cheng, “Research on Multi-Step Active Disassembly Method of products Based on ADSM,” Conference of Manufacturing Engineering and Automation, Vol. 139-141, Guangzhou, 2010, pp. 1428-1432.
[11] J. D. Chiodo and C. Boks, “Assessment of End-of-Life Strategies with Active Disassembly Using Smart Materials,” The Journal of Sustainable Product Design, Vol. 2, No. 1-2, 2002, pp. 69-82. doi:10.1023/B:JSPD.0000016422.01386.7c
[12] J. Peng, “Humid and Hot Environment and Electronic Product Reliability,” Electronic Product Reliability and Environmental Testing, Vol. 5, 2003, pp. 57-60.
[13] J. P. Zu and C. Q. Xu, “The Simulation and Investigation for Free-Drop of Mobile Phone,” Manufacture Information Engineering of China, Vol. 35, No. 11, 2006, pp. 68-70.
[14] J. Ding, G. Li, C. Q. Xue and L. Yu, “A Study on Anti-impact Property of the Bottom Shape of Plastic Mobile Phone Case,” Electro-Mechanical Engineering, Vol. 25, No. 1, 2009, pp. 42-48.
[15] B. Y. Peng, J. B. Xie, Q. H. Feng and G. F. Yin, “Digitalized Analysis of Open-faced Mobile Phone Damage Caused by Falling,” Journal of Xihua University, Vol. 28, No. 1, 2009, pp. 74-77.

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