Design and Implement of Low Power Consumption SRAM Based on Single Port Sense Amplifier in 65 nm

Abstract

With the rapid development of integrated circuits [1], low power consumption has become a constant pursuiting goal of the designer in chip design. As the memory almost takes up the area of the chip, reducing memory power consumption will significantly reduce the overall power consumption of the chip; according to ISSCC’s 2014 report about technology trends discussions, there two points of the super-low power SRAM design: 1) design a more effective static and dynamic power control circuit for each key module of SRAM; 2) ensure that in the case of the very low VDD min, SRAM can operating reliably and stably. This paper makes full use reliable of 8T cell, and the single-port sense amplifier has solved problems in the traditional 8T cell structure, making the new structure of the memory at a greater depth still maintain good performance and lower power consumption. Compared with the designed SRAM the SRAM generated by commercial compiler, as the performance loss at SS corner does not exceed 10%, the whole power consumption could be reduced by 54.2%, which can achieve a very good effect of low-power design.

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Li, S. , Chen, J. , Xing, Z. , Shao, J. and Peng, X. (2015) Design and Implement of Low Power Consumption SRAM Based on Single Port Sense Amplifier in 65 nm. Journal of Computer and Communications, 3, 164-168. doi: 10.4236/jcc.2015.311026.

Conflicts of Interest

The authors declare no conflicts of interest.

References

[1] Rabaey, J.M. and Chandrakasan, A. (2004) Digital Integrated Circuits: A Design Perspective. 2nd Edition.
[2] Nalam, S., Chandra, V., Pietrzyk, C., Aitken, R.C. and Calhoun, B.H. (2010) Asymmetric 6T SRAM with Two-Phase Write and Split Bitline Differential Sensing for Low Voltage Operation. Proc. 11th Int. Symp. Qual. Electron. Des. (ISQED), March 2010, 139-146. http://dx.doi.org/10.1109/isqed.2010.5450400
[3] Jeong, H., Kim, T., Song, T., Kim, G. and Jung, S.-O. Trip-Point Bit-Line Precharge Sensing Scheme for Single-Port SRAM. IEEE Transactions on VLSI Sys-tems.
[4] Javanifard, J. (2008) A 45 nm Self-Aligned-Contact Process 1 Gb NOR Flash with 5 MB/s Program Speed. IEEE Int. Solid-State Circuits Conf. Dig. Tech. Papers, February 2008, 424-624.
[5] Giridhar, B., Pinckney, N., Sylvester, D. and Blaauw, D. (2014) 13.7 A Reconfigurable Sense Amplifier with Auto- Zero Calibration and Pre-Amplification in 28 nm CMOS. IEEE Int. Solid-State Circuits Conf. Dig. Tech. Papers, February 2014, 242-243.
[6] Verma, N. and Chandrakasan, A.P. (2008) A High-Density 45 nm SRAM Using Small-Signal Non-Strobed Regenerative Sensing. IEEE Int. Solid-State Circuits Conf. Dig. Tech. Papers, February 2008, 380-621.

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