Investigation of the Effect of Film Thickness and Heat Treatment on the Optical Properties of TeSeSn Thin Films

DOI: 10.4236/wjcmp.2015.53023   PDF   HTML   XML   3,794 Downloads   4,413 Views   Citations


Glassy substrates TeSeSn thin films were thermally evaporated onto chemically cleaned glass. The as-deposited (as-prepared) and annealed thin films were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD) and optical transmission. The optical absorption of the as-prepared and annealed TeSeSn thin films is studied in the wavelength range of 300 nm - 900 nm. The direct optical energy gap (Eg) increases from 1.989 to 2.143 eV with increasing the thickness of the as-prepared films from 100 to 200 nm. The annealed TeSeSn films showed a decrease in the optical energy gap with increasing the annealing temperature. The effect of heat treatment on the lattice dielectric constant (εL) and carrier concentration (N) are also studied.

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Alwany, A. , Samir, O. , Algradee, M. , Hafith, M. and Abdel-Rahim, M. (2015) Investigation of the Effect of Film Thickness and Heat Treatment on the Optical Properties of TeSeSn Thin Films. World Journal of Condensed Matter Physics, 5, 220-231. doi: 10.4236/wjcmp.2015.53023.

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The authors declare no conflicts of interest.


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