Metal Nano Layer Coating for Improving the Detection and Recognition of Micro-Poisons Using Reflection Spectroscopic Measurement

Amir Abramovich; Alexander Shulzinger; Meir Ochana; David Rotshild

doi:10.4236/opj.2015.55018

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Optics and Photonics Journal > Vol.5 No.5, May 2015

Metal Nano Layer Coating for Improving the Detection and Recognition of Micro-Poisons Using Reflection Spectroscopic Measurement ()

Amir Abramovich^*, Alexander Shulzinger, Meir Ochana, David Rotshild

Department of Electrical and Electronic Engineering, Ariel University, Ariel, Israel.

DOI: 10.4236/opj.2015.55018 PDF HTML XML 2,371 Downloads 2,830 Views Citations

Abstract

Metal nano layer coating for increasing the sensitivity of spectroscopic measurements is proposed and experimentally demonstrated in this paper. The metal nano layer will attract the micro-poisons from any measured aqueous sample increasing the concentration of the micro-poison in the vicinity of the surface and significantly improves the sensitivity of the spectroscopic measurement. The demonstration was carried out using Fourier Transform Infra-Red (FTIR) operating in the MIR 400 cm^-1 - 4000 cm^-1 and 5 nm Gold layer which was grown on silicon oxide substrate. In the experimental demonstration Malathion organophosphate pesticide was used as micro-poison. The spectroscopic measurement proves that Malathion was attracted to the metal nano layer. Furthermore, the absorption lines of Malathion were detected and recognized. This proof of principle can be applied to any Internal Reflection Elements (IRE) and it can be used to purify any aqueous solutions and atmosphere from micro-poisons which will be attracted to the metal Nano layer.

Keywords

FTIR Spectroscopy, Internal Reflection Element (IRE), Metal Nano Layer Coating, Detection of Micro-Poisons, Organophosphates

Share and Cite:

Abramovich, A. , Shulzinger, A. , Ochana, M. and Rotshild, D. (2015) Metal Nano Layer Coating for Improving the Detection and Recognition of Micro-Poisons Using Reflection Spectroscopic Measurement. Optics and Photonics Journal, 5, 193-199. doi: 10.4236/opj.2015.55018.

Conflicts of Interest

The authors declare no conflicts of interest.

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