Self-Sensing and –Actuating Probes for Tapping Mode AFM Measurements of Soft Polymers at a Wide Range of Temperatures

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DOI: 10.4236/jmp.2011.22012    4,924 Downloads   9,857 Views   Citations


Self-sensing and –actuating probes optimized for conventional tapping mode atomic force microscopy (AFM) are described. 32-kHz quartz tuning forks with a chemically etched and focus ion beam (FIB) sharpened (curvature radii are 5-10 nm) tungsten tip are stable at air and liquid nitrogen atmosphere and at a wide range of temperatures. If driven at constant frequency, the scan speed of such sensors can be up to 3 Hz. AFM was performed on polymer samples in order to study the stability and applicability of these sensor for investigation of soft materials with high dynamical tendencies.

Cite this paper

N. Matsko, J. Wagner, A. Efimov, I. Haynl, S. Mitsche, W. Czapek, B. Matsko, W. Grogger and F. Hofer, "Self-Sensing and –Actuating Probes for Tapping Mode AFM Measurements of Soft Polymers at a Wide Range of Temperatures," Journal of Modern Physics, Vol. 2 No. 2, 2011, pp. 72-78. doi: 10.4236/jmp.2011.22012.

Conflicts of Interest

The authors declare no conflicts of interest.


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