Curvature, Hybridization and Contamination of Carbon Nanostructures Analysis Using Electron Microscopy and XANES Spectroscopy

Rolant Eba Medjo, Bridinette Thiodjio Sendja, Jeannot Mane Mane

Department of Mathematics and Physical Sciences, Ecole Nationale Supérieure Polytechnique (National Advanced School of Engineering), University of Yaoundé I, Yaoundé, Cameroon.
Department of Mathematics and Physical Sciences, Ecole Nationale Supérieure Polytechnique (National Advanced School of Engineering), University of Yaoundé I, Yaoundé, Cameroon; Basical Scientist Teaching (ESB) Department, Training School of Secondary Technical School Teachers (ENSET), University of Douala, Douala, Cameroon.
Physics Department, Faculty of Science, University of Douala I, Douala, Cameroon.

DOI: 10.4236/msa.2014.52014                

Abstract

The ability to control the nanoscale shape of carbon nanostructures during wide-scale synthesis process is an essential goal in research for Nanotechnology applications. This paper reports a significant progress toward that goal. Variant CVD has been used for the synthesis of the samples studied. Curvature, hybridization and contamination are analyzed using Electron Microscopies and XANES spectroscopy. The investigations of the results show that four types of samples are obtained. They are carbon nanotubes (CNTs), carbon nanofibers (CNFs), carbon nanowalls (CNWs) and carbon nanoparticles (CNPs). Almost all of them have catalyst nanoparticles (metal) on top in top growth model or on base in base growth model and encapsulated or adsorbed in sidewalls. The orientation of tubular carbon nanomaterials depends on operating parameters. They are classified in three groups: the poorly oriented, the medium oriented and the highly oriented. Their contamination (radicals, atoms and molecules) and hybridization are intrinsically related to the curvature of their graphene layers. XANES spectroscopy allows quantitative characterization of nanomaterials.

Keywords

Carbon Nanostructures; XANES Spectroscopy; Electron Microscopy; Characterization; Contamination

Conflicts of Interest

The authors declare no conflicts of interest.

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