The Study of Relaxation Time in Test of 940 nm Semiconductor Laser


Conventional test of the peak wavelength of a laser used to be applied immediately after a device is injected current. However, the results can not be considered as an accurate description to temperature characteristic. This passage puts forward a concept of relaxation time in wavelength texts, mainly based on the experiment of 940 nm strain quantum well laser, confirming that under constant current, wavelength will get through a process of rising, and then, reach the limit. This process brings the effect on spectral characteristics of a device which cannot be ignored and the accumulated heat in relaxation time will gradually impact the emission wavelength of the laser, even crest split to form bimodal phenomenon.

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Li, J. , Li, J. , Liu, T. , Cui, B. , Deng, J. , Han, J. , He, L. and Lin, S. (2013) The Study of Relaxation Time in Test of 940 nm Semiconductor Laser. Journal of Computer and Communications, 1, 46-49. doi: 10.4236/jcc.2013.17011.

Conflicts of Interest

The authors declare no conflicts of interest.


[1] R. Pathak, J. Minelly, J. Haapamaa, J. Watson, D. Schleuning, H. Winhold, et al., “915 nm Laser Bar Based High-Performance Sources for Fiber Laser Pumping,” 2009, Article ID: 719808
[2] X. Z. Ma, J. Huo, Y. Qu and S. L. Du, “8 Temperature Characteristics of 808 nm Semiconductor Lasers,” Infrared and Laser Engineering, Vol. 12, 2010, pp. 1306-1309.
[3] G. R. He, W. J. Shen, Q. Wang, W. H. Zheng and L. H. Chen,“Temperature Characteristics of 980 nm High Power Vertical Cavity Surface Emitting Lasers,”Infrared and Laser Engineering, Vol. 1, 2010, pp. 57-60.
[4] H. W. Qu, X. Guo, L. M. Dong, J. Deng, X. L. Da, Z. T. Xu and G. D. Shen, “Study on the Temperature Characteristics of Vertical Cavity Surface Emitting Laser,” Infrared and Laser Engineering, Vol. 2, 2005, pp. 83-86.

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