The Study of Relaxation Time in Test of 940 nm Semiconductor Laser

DOI: 10.4236/jcc.2013.17011   PDF   HTML     2,970 Downloads   4,414 Views   Citations


Conventional test of the peak wavelength of a laser used to be applied immediately after a device is injected current. However, the results can not be considered as an accurate description to temperature characteristic. This passage puts forward a concept of relaxation time in wavelength texts, mainly based on the experiment of 940 nm strain quantum well laser, confirming that under constant current, wavelength will get through a process of rising, and then, reach the limit. This process brings the effect on spectral characteristics of a device which cannot be ignored and the accumulated heat in relaxation time will gradually impact the emission wavelength of the laser, even crest split to form bimodal phenomenon.

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Li, J. , Li, J. , Liu, T. , Cui, B. , Deng, J. , Han, J. , He, L. and Lin, S. (2013) The Study of Relaxation Time in Test of 940 nm Semiconductor Laser. Journal of Computer and Communications, 1, 46-49. doi: 10.4236/jcc.2013.17011.

Conflicts of Interest

The authors declare no conflicts of interest.


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