Current Mode Logic Testing of XOR/XNOR Circuit: A Case Study


This paper investigates the issue of testing Current Mode Logic (CML) gates. A three-bit parity checker is used as a case study. It is first shown that, as expected, the stuck-at fault model is not appropriate for testing CML gates. It is then proved that switching the order in which inputs are applied to a gate will affect the minimum test set; this is not the case in conventional voltage mode gates. Both the circuit output and its inverse have to be monitored to reduce the size of the test set.

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M. Fouad, H. Amer, A. Madian and M. Abdelhalim, "Current Mode Logic Testing of XOR/XNOR Circuit: A Case Study," Circuits and Systems, Vol. 4 No. 4, 2013, pp. 364-368. doi: 10.4236/cs.2013.44049.

Conflicts of Interest

The authors declare no conflicts of interest.


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