Surface Characterisation of a Ferroelectric Single Crystal by Kelvin Probe Force Microscopy


We investigated the surface potential dynamics of a ferroelectric Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 (PIMNT) single crystal using Kelvin probe force microscopy (KPFM). The initial surface potential is a function of the applied bias since it reflects the interplay between the polarisation and screen charges. It is suggested that the different rates of tip injected charges are responsible for the asymmetric behaviour of the initial surface potential dependent on the sign of the applied bias. The polarisation, screen and tip injected charges are considered to explain the difference in surface potential dynamics.

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Lau, K. , Liu, Y. , Li, Q. , Li, Z. , Withers, R. and Xu, Z. (2013) Surface Characterisation of a Ferroelectric Single Crystal by Kelvin Probe Force Microscopy. Journal of Surface Engineered Materials and Advanced Technology, 3, 190-194. doi: 10.4236/jsemat.2013.33026.

Conflicts of Interest

The authors declare no conflicts of interest.


[1] S. Magonov, J. Alexander and S. Wu, “Advancing Characterization of Materials with Atomic Force Microscopy-Based Electric Techniques,” In: S. V. Kalinin and A. Gruverman, Ed., Scanning Probe Microscopy of Functional Materials, Springer, New York, 2011, pp. 233-300.
[2] R. Berger, H. J. Butt, M. B. Retschke and S. A. L. Weber, “Electrical Modes in Scanning Probe Microscopy,” Macromolecular Rapid Communications, Vol. 30, No. 14, 2009, pp. 1167-1178. doi:10.1002/marc.200900220
[3] A. Avila and B. Bhushan, “Electrical Measurement Techniques in Atomic Force Microscopy,” Critical Reviews in Solid State and Materials Sciences, Vol. 35, No. 1, 2010, pp. 38-51. doi:10.1080/10408430903362230
[4] S. V. Kalinin, S. Jesse, B. J. Rodriguez, K. Seal, A. P. Baddorf, T. Zhao, Y. H. Chu, R. Ramesh, E. A. Eliseev, A. N. Morozovska, B. Mirman and E. Karapetian, “Recent Advances in Electromechanical Imaging on the Nanometer Scale: Polarization Dynamics in Ferroelectrics, Biopolymers, and Liquid Imaging,” Japanese Journal of Applied Physics, Vol. 46, No. 9A, 2007, pp. 5674-5685.
[5] W. Melitz, J. Shen, A. C. Kummel and S. Lee, “Kelvin Probe Force Microscopy and Its Application,” Surface Science Reports, Vol. 66, No. 1, 2011, pp. 1-27. doi:10.1016/j.surfrep.2010.10.001
[6] S. Barbet, R. Aubry, M. A. di Forte-Poisson, J. C. Jacquet, D. Deresmes, T. Melin and D. Theron, “Surface Potential of n- and p-Type GaN Measured by Kelvin Force Microscopy,” Applied Physics Letters, Vol. 93, No. 21, 2008, pp. 212107-212107-3. doi:10.1063/1.3028639
[7] Y. Rosenwaks, R. Shikler, T. Glatzel and S. Sadewasser, “Kelvin Probe Force Microscopy of Semiconductor Surface Defects,” Physical Review B: Condensed Matter and Materials Physics, Vol. 70, No. 8, 2004. doi:10.1103/PhysRevB.70.085320
[8] J. Lu, L. Eng, R. Bennewitz, E. Meyer, H. J. Guntherodt, E. Delamarche and L. Scandella, “Surface Potential Studies of Self-Assembling Monolayers Using Kelvin Probe Force Microscopy,” Surface and Interface Analysis, Vol. 27, No. 5-6, 1999, pp. 368-373. doi:10.1002/(SICI)1096-9918(199905/06)27:5/6<368::AID-SIA530>3.0.CO;2-W
[9] K. J. Kwak, S. Yoda and M. Fujihira, “Observation of Stretched Single DNA Molecules by Kelvin Probe Force Microscopy,” Applied Surface Science, Vol. 210, No. 1-2, 2003, pp. 73-78. doi:10.1016/S0169-4332(02)01482-4
[10] S. Kalinin and D. Bonnell, “Local Potential and Polarization Screening on Ferroelectric Surfaces,” Physical Review B: Condensed Matter and Materials Physics, Vol. 63, No. 12, 2001. doi:10.1103/PhysRevB.63.125411
[11] S. V. Kalinin, C. Y. Johnson and D. A. Bonnell, “Domain Polarity and Temperature Induced Potential Inversion on the BaTiO[sub 3](100) Surface,” Journal of Applied Physics, Vol. 91, No. 6, 2002, p. 3816. doi:10.1063/1.1446230
[12] V. M. Fridkin, “Ferroelectric Semiconductors,” Consultants Bureau, 1980.
[13] Q. Li, Y. Liu, D. Y. Wang, R. L. Withers, Z. R. Li, H. S. Luo and Z. Xu, “Switching Spectroscopic Measurement of Surface Potentials on Ferroelectric Surfaces via an Open-Loop Kelvin Probe Force Microscopy Method,” Applied Physics Letters, Vol. 101, No. 24, 2012. doi:10.1063/1.4772511
[14] K. Lau, Y. Liu, Q. Li, Z. R. Li, R. L. Withers and Z. Xu, “Domain-Selective Photochemical Reaction on Oriented Ferroelectric Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 Single Crystals,” Applied Surface Science, Vol. 265, No., 2013, pp. 157-161.
[15] Y. Kim, S. Buhlmann, J. Kim, M. Park, K. No, Y. K. Kim and S. Hong, “Local Surface Potential Distribution in Oriented Ferroelectric Thin Films,” Applied Physics Letters, Vol. 91, No. 5, 2007, Article ID: 052906. doi:10.1063/1.2761502
[16] Y. Kim, C. Bae, K. Ryu, H. Ko, Y. K. Kim, S. Hong and H. Shin, “Origin of Surface Potential Change during Ferroelectric Switching in Epitaxial PbTiO3 Thin Films Studied by Scanning Force Microscopy,” Applied Physics Letters, Vol. 94, No. 3, 2009, Article ID: 032907. doi:10.1063/1.3046786
[17] Y. Kim, M. Park, S. Buhlmann, S. Hong, Y. K. Kim, H. Ko, J. Kim and K. No, “Effect of Local Surface Potential Distribution on Its Relaxation in Polycrystalline Ferroelectric Films,” Journal of Applied Physics, Vol. 107, No. 5, 2010. doi:10.1063/1.3290953
[18] J. Shen, H. Z. Zeng, Z. H. Wang, S. B. Lu, H. D. Huang and J. S. Liu, “Study of Asymmetric Charge Writing on Pb(Zr,Ti)O-3 Thin Films by Kelvin Probe force Microscopy,” Applied Surface Science, Vol. 252, No. 22, 2006, pp. 8018-8021. doi:10.1016/j.apsusc.2006.01.078
[19] H. Yamada, X. Q. Chen, T. Horiuchi, K. Matsushige, S. Watanabe, M. Kawai and P. S. Weiss, “Surface Potential of Ferroelectric Thin Films Investigated by Scanning Probe Microscopy,” Journal of Vacuum Science & Technology B, Vol. 17, No. 5, 1999, pp. 1930-1934. doi:10.1116/1.590851
[20] J. Heo, “A Study of the Ferroelectric Properties of PbZr0.4Ti0.6O3 (PZT) Grains Using Kelvin Force Microscopy Analysis,” Transactions on Electrical and Electronic Materials, Vol. 11, No. 6, 2010, pp. 275-278. doi:10.4313/TEEM.2010.11.6.275
[21] Q. Li, Y. Liu, J. Schiemer, P. Smith, Z. Li, R. L. Withers and Z. Xu, “Fully-Inverted Piezoresponse Hysteresis Loops Mediated by Charge Injection in Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 Single Crystals,” Applied Physics Letters, Vol. 98, No. 9, 2011, Article ID: 092908. doi:10.1063/1.3562034
[22] Y. L. Qian Li, R. L. Withers, Y. H. Wan, Z. R. Li and Z. Xu, “Piezoresponse Force Microscopy Studies on the Domain Structures and Local Switching Behavior of Pb (In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 Single Crystals,” Journal of Applied Physics, Vol. 112, No. 5, 2012, Article ID: 052006.
[23] A. L. Kholkin, I. K. Bdikin, V. V. Shvartsman and N. A. Pertsev, “Anomalous Polarization Inversion in Ferroelectrics via Scanning Force Microscopy,” Nanotechnology, Vol. 18, No. 9, 2007. doi:10.1088/0957-4484/18/9/095502
[24] Y. J. Oh, J. H. Lee and W. Jo, “Dynamics of Space and Polarization Charges of Ferroelectric Thin Films Measured by Atomic Force Microscopy,” Ultramicroscopy, Vol. 106, No. 8-9, 2006, pp. 779-784. doi:10.1016/j.ultramic.2005.12.015

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