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Microstructure Analysis and Properties of Anti-Reflection Thin Films for Spherical Silicon Solar Cells

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DOI: 10.4236/epe.2013.52A003    3,913 Downloads   6,047 Views   Citations

ABSTRACT

Structure and properties of anti-reflection thin films of spherical silicon solar cells were investigated and discussed. Conversion efficiencies of spherical Si solar cells coated with F-doped SnO2 anti-reflection films were improved by annealing. Optical absorption and fluorescence of the solar cells increased after annealing. Lattice constants of F-doped SnO2 anti-reflection layers, which were investigated by X-ray diffraction, decreased after annealing. A mechanism of atomic diffusion of F in SnO2 was discussed. The present work indicated a guideline for spherical silicon solar cells with higher efficiencies.

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M. Kanayama, T. Oku, T. Akiyama, Y. Kanamori, S. Seo, J. Takami, Y. Ohnishi, Y. Ohtani and M. Murozono, "Microstructure Analysis and Properties of Anti-Reflection Thin Films for Spherical Silicon Solar Cells," Energy and Power Engineering, Vol. 5 No. 2A, 2013, pp. 18-22. doi: 10.4236/epe.2013.52A003.

Conflicts of Interest

The authors declare no conflicts of interest.

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